GB/T 32281-2015

Active

Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry

太阳能级硅片和硅料中氧、碳、硼和磷量的测定 二次离子质谱法

Standard Type
GBT
ICS
77.040.30
CCS
H17
Status
Active
Issue Date
2015-12-10
Implementation
2017-01-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies a test method using secondary ion mass spectrometry to measure the concentrations of oxygen, carbon, boron, and phosphorus in solar-grade silicon wafers and feedstock. It is applied in the photovoltaic industry for quality control and material characterization of silicon used in solar cell manufacturing. The method ensures accurate impurity analysis critical for evaluating wafer performance and feedstock purity.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.